《Springer手册精选系列·纳米技术手册：扫描探针显微镜（第3册）（第3版·影印版）》具有先进、全面、易查、实用等特点，是非常实用的跨学科工具书，可供从事或即将从事这一领域研究的研究人员、科学家和工程师参考，也可供教学人员和研究生、高年级本科生使用。

　　《纳米技术手册》详尽阐述基本概念及纳米材料、器件、加工等内容；1500多幅插图、众多的综合表帮助理解和使用；给出了详尽的参考数据。

　　Dr. Bharat Bhushan received an M.S. in mechanical engineering from the Massachusetts Institute of Technology in 1971，an M.S. in mechanics and a Ph.D. in mechanical engineering from the University of Colorado at Boulder in 1973 and 1976，respectively，an MBA from Rensselaer Polytechnic Institute at Troy，NY in 1980，Doctor Technicae from the University of Trondheim atTrondheim，Norway in 1990，a Doctor of Technical Sciences from the Warsaw University of Technology at Warsaw，Poland in 1996，and Doctor Honouris Causa from the National Academy of Sciences at Gomel，Belarus in 2000. He is a registered professional engineer. He is presently an Ohio Eminent Scholar and The Howard D. Winbigler Professor in the College of Engineering，and the Director of the Nanoprobe Laboratory for Bio- and Nanotechnology and Biomimetics （NLB2） at the Ohio State University，Columbus，Ohio.His research interests include fundamental studies with a focus on scanning probe techniques in the interdisciplinary areas of bio/nanotribology，bio/nanomechanics and bio/nanomaterials characterization，and applications to bio/nanotechnology and biomimetics. He is an internationally recognized expert of bio/nanotribology and bio/nanomechanics using scanmng probe microscopy，and is one of the most prolific authors. He is considered by some a pioneer of the tribology and mechanics of magnetic storage devices. He has authored 6 scientific books，more than 90 handbook chapters，more than 700 scientific papers （h factor - 45+； ISI Highly Cited in Materials Science，since 2007），and more than 60 technical reports，edited more than 45 books，and holds 17 US and foreign patents. He is co-editor of Springer Nano Science and Technology Series and coeditor of Microsystem Technologies. He has given more than 400 invited presentations on six continents and more than 140 keynote/plenary addresses at major international conferences.

缩略语
Part C 扫描探针显微镜
21.扫描探针显微镜——工作原理、检测方法和探测
21.1 扫描隧道显微镜
21.2 原子力显微镜
21.3 原子力显微镜检测方法与分析
参考文献

22.扫描显微镜的普通探针和特殊探针
22.1 原子力显微镜
22.2 扫描隧道显微镜
参考文献

23.非接触式原子力显微镜及相关问题
23.1 原子力显微镜
23.2 半导体中的应用
23.3 绝缘体中的应用
23.4 分子中的应用
参考文献

24.低温扫描探针显微镜
24.1 显微镜低温操作
24.2 检测方法
24.3 扫描隧道显微镜与光谱学
24.4 扫描力显微镜与光谱学
参考文献

25.动态力显微镜中的高谐波和时变力
25.1 轻敲模式原子力显微镜的探针样品的相互作用力建模
25.2 增强时变力下的悬臂梁响应
25.3 应用实例
25.4 高谐波小振幅力显微镜
参考文献

26.原子力显微镜的动态模型
26.1 单原子键的测量机制
26.2 谐波振荡器：原子力显微镜的动态模型系统
26.3 动态原子力显微镜的工作模型
26.4 Q-控制
26.5 动态原子力显微镜的耗散方法测量
26.6 结论
参考文献

27.分子识别力学显微镜：从分子键到复杂的能量形貌
27.1 尖端化学配位
27.2 探针表面受体的固定
27.3 单分子识别的力学探测
27.4 分子识别力谱的原则
27.5 力谱识别：从孤立分子到生物膜
27.6 图像识别
27.7 结束语
参考文献